MSE-636(a) / 1 crédit

Enseignant(s): Cantoni Marco, Navratilova Lucie, Oveisi Emadeddin

Langue: Anglais

Remark: Next time: October 7-9, 2024


Frequency

Every year

Summary

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Content

This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will
provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical
techniques EDS and EBSD, related theories of image formation.
Demonstrations will be given on the microscopes.
2x Year Spring (b) and autumn (a).

Keywords

SEM, FIB, ESEM

Assessment methods

Written

Dans les plans d'études

  • Nombre de places: 31
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: Scanning electron microscopy techniques (a)
  • Cours: 11 Heure(s)
  • Exercices: 1 Heure(s)
  • TP: 2 Heure(s)
  • Type: optionnel
  • Nombre de places: 31
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: Scanning electron microscopy techniques (a)
  • Cours: 11 Heure(s)
  • Exercices: 1 Heure(s)
  • TP: 2 Heure(s)
  • Type: optionnel

Semaine de référence

Cours connexes

Résultats de graphsearch.epfl.ch.