MSE-735 / 1 crédit

Enseignant(s): Boureau Victor Carle Adrien, Cantoni Marco, Oveisi Emadeddin, Reyes Vasquez David Fernando

Langue: Anglais


Every year


This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.



Transmission electron microscopy, EDX analysis, EELS


Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"



Moodle Link

Dans les plans d'études

  • Nombre de places: 30
  • Forme de l'examen: Exposé (session libre)
  • Matière examinée: Scanning and Analytical Transmission Electron Microscopy
  • Cours: 11 Heure(s)
  • Exercices: 3 Heure(s)
  • TP: 8 Heure(s)

Semaine de référence

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