MSE-715 / 2 crédits

Enseignant(s): Alexander Duncan, Boureau Victor Carle Adrien, Cantoni Marco, Invited lecturers (see below), Oveisi Emadeddin

Langue: Anglais


Every 2 years


Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.



STEM theory and instrumentation, STEM imaging modes, Aberration-corrected STEM, Quantitative STEM, STEM image simulation, EELS: basic principles, data acquisition and processing, EDX: basic principles, data acquisition and processing, HyperSpy, independent component analysis.

Learning Prerequisites

Required courses

MSE-637 or equivalent

Assessment methods

Oral exam



Dans les plans d'études

  • Nombre de places: 30
  • Forme de l'examen: Oral (session libre)
  • Matière examinée: Fundamentals of STEM lmaging and Spectroscopy
  • Cours: 18 Heure(s)
  • TP: 18 Heure(s)

Semaine de référence

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